This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (such as striplines and electromagnetic pulse simulators) and closed structures (such as TEM cells). These structures can be further divided into single-port, dual-port, or multi-port TEM waveguides. The frequency range depends on the specific test requirements and the specific TEM waveguide type.

this document provides
　　
– TEM waveguide characteristics, including typical frequency ranges and device under test (EUT) size limitations;
　　
– TEM waveguide verification method for electromagnetic compatibility (EMC) testing;
　　
– Definition of EUT (i.e. EUT cabinet and wiring);-TEM waveguide
　　
Test settings, procedures and requirements for medium radiation emission measurement;
　　
Test setup, procedures and requirements for radiated immunity testing in TEM waveguides.
　　
Note: This document defines test methods used to measure the effect of electromagnetic radiation on equipment and electromagnetic radiation from associated equipment. Simulations and measurements of electromagnetic radiation are not accurate enough to quantitatively determine the impact on all end-uses. The main goal of the defined test method is to establish sufficient reproducibility of results across various test facilities to allow qualitative analysis of the impact.
　　
This document is not intended to specify application to any specific equipment or
　　
System testing.
　　
The main purpose of this document is to provide a common basic reference for all interested IEC product committees. For radiated emission measurements, products
　　
Committee based on CISPR
　　
Standards select emission limits and measurement methods. For radiated immunity testing, product committees remain responsible for the
　　
appropriate choice of immunity tests and immunity test limits to be applied to equipment within
　　
their scope. This document describes a description of independent
　　
Test methods for IEC 61000-4-3 [34].1